The universal Component-Testsystem TBT 8812 for the test of almost all major electronic
components.
Das universelle Bauteile-Testsystem TBT 8812, zum Testen aller handelsüblichen
elektronischen Bauteile.
| Option: | Description: |
|---|---|
| TBTDIS: | Library of the normally used Testparameters, which are necessary to build up a Testprogram for discretes. These Testparameters have to be filled out with the right values. |
| TBTLINP: | Library of the normally used Testparameters, which are necessary to build up a Testprogram for linears. These Testparameters have to be filled out with the right values. |
| TBTDIGP: | Program Library for the Option TBTDIGB, consists of at about 600 Testprograms for the mostly used CMOS and TTLIC.s. These Testprograms are build up with the functional Tests over truthtesttable, and DCParame- ters. Only with Truthtable for TBTDIGA. |
| TBTMIXB: | > Library of the normally used Testparameters, which are necessary to build up a Testprogram for mixed Signal Components. These Testparameters have to be filled out with the right values. |
| TBTTIME: | Zeitmeßoption, zur Messung von Schaltzeiten an den zu testenden Bauelementen. Besteht aus, in das System, über IEEE488 Bus integriertem Digital Speicherscope. Zeitmessungen bis zu einer maximalen Auflösung von 100 bis 1,25 Nanosekunden möglich (je nach verwendetem Gerät). ermöglicht auch die Speicherung und Darstellung von diversen Kurvenformen, wie Einschwingvorgänge usw. |
| DC 112: | Current/Voltage Source, 4,096V/15A, and 40,96V/15A, 12 Bit resolution in each Range, used to stimulate the "Input" of Components, necessary for all discrete, linear and mixed Signal Components with more then 2 Terminals. |
| DC 2/412: | Current/Voltage Source, consists of 3 Current/Voltage Sources, 12 Bit resolution, 2,048V/20A, 20,48V/20A and 204,8V/200mA with different current ranges. This Source is used as the Powersource for all discrete, all linears and mixed Signal Components. |
| DC 312: | Current Source, 15V/200A, 12 Bit resolution, is used for all Components which requires more then 20A Current. Only 300µs Pulses. |
| DC 312H: | Current Source, 25V/200A, 12 Bit resolution, is used for all Components which requires more then 20A Current. Max. 500ms Pulse, is useful for Zth testing. |
| DC 312/400: | Current Source, 15V/400A, 12 Bit resolution, is used for all Components which requires more then 20A Current. Only 300µs Pulses. |
| DC 312/600: | Current Source, 15V/600A, 12 Bit resolution, is used for all Components which requires more then 20A Current. Only 300µs Pulses. |
| DC 512: | Current/Voltage Source, 2000V/10mA, 12 Bit resolution, this Source is required, if Leakage and Break down with more then 200V should be tested. |
| DC 5.212: | Current/Voltage Source, 2000V/20mA, 12 Bit resolution, this Source is required, if Leakage and Breakdown with more then 200V should be tested. |
| DC 612: | Current/Voltage Source, 3000V/10mA, 12 Bit resolution, this Source is required, if Leakage and Breakdown with more then 200V should be tested. |
| TBTSTT: | Discrete Family-Testterminal, this Option is equipped with a Matrix for 3000V/200A, to max. 4 Terminal Devices. Each TBT 8812 can use 4 of these Testterminals and will handle 4 different Testprograms sequentially. This Test-Terminal can work with all Adaptors for discrete Devices. It also can be equipped with a Handler Interface. It Has a Binning Display for max.24 Bins, and LED´s for "PASS", "FAIL" and "KELVIN FAIL". |
| TBTHV: | Discrete Family-Testterminal, this Option is equipped with a Matrix for 6000V/200A, to max. 4 Terminal Devices. Each TBT 8812 can use 4 of these Testterminals and will handle 4 different Testprograms sequentially. This Test-Terminal can work only with HVAdaptors for discrete Devices. It also can be equipped with a Handler Interface. It has a Binning Display for max. 24 Bins, and LED´s for "PASS", "FAIL" and "KELVIN FAIL". |
| TBTHI: | Handlerinterface for all Family-Testterminals, to provide the different HandshakeSignals, to work with Probing and Handlingssystems of all major suppliers. One for each FamilyTestterminal needed. |
| TBTMTT: | Matrix Family-Testterminal, this Option is equipped with a Matrix for 2000V/200A, for 4 Terminal Devices, and also with a 5 X 24 Crossmatrix for 1500V/20A. Each TBT 8812 can use 4 of these Testterminals and will handle 4 different Testprograms sequentially. This Testterminal can work with all Adaptors for discrete Devices, and also with all the Adaptors for the TBTMUX. It also can be equipped with a Handler-Interface. It has a Binning Display for max. 24 Bins, and a Contact Failure LED. This Family Testterminal is developped for passiv and activ arrays (RPACKS, Transistor Arrays a. o.), Optocouplers, SmartPowers and Hybrids. |
| TBTMUX1: | Matrix for the TBTSTT, this Option is equipped 3 X 18 Crossmatrix for 500V/10A. Each TBTSTT can use 1 of these Options. This Option is developped for passiv and activ arrays (RPACKS, Transistor Arrays a. o.), Optocouplers, SmartPowers and Hybrids. |
| TBTMUX2: | For the TBTSTT, this Option is equipped with a 3 X 18 Crossmatrix for 1000V/10A. Each TBTSTT can use 1 of these Options. This Option is developped for passiv and activ arrays (RPACKS, Transistor Arrays a. o.), Optocouplers, SmartPowers and Hybrids. |
| TBTSCAN1: | Scanneroption for the TBTSTT, it is equipped with a 3 X 32 Scannermatrix for 1000V/10A. Each TBTSTT can use 1 of these Options. This Option is developped for passiv and activ arrays (RPACKS, Transistor Arrays a. o.), Optocouplers, and for Burn In. |
| TBTSCANE: | Scannerextender for the TBTSCAN1, it consists of a 3 X 16 Scannermatrix for 1000V/10A. Each TBTSCAN1, can use 2 of these Options. |
| TBTLIN: | Linear Family-Testterminal, this Option is equipped with a 8 X 32 Crossmatrix for 200V/20 and 2 additional current/voltage Sources with 2x +15V/1A and 2x 15V/1A. A TimeMeasurement unit is included in the TBTLIN. Each TBT 8812 can use one of these Testterminals and can test OPAMPS, COMPARATORS, TIMERS and other linears with this Option. |
| TBTDIGF: | Digital Family-Testterminal, it can test up to 20 Pin CMOS and TTL components, which are mostly used. It testes the function of these IC.s over the Truthtable and includes a Library of at about 600 Testprograms. It has an additional function, to read, write, store and burn EPROMS, and test with this function also static RAMS. |
| TBTDIGA: | Digital Family-Testterminal, it can test up to 20 Pin 300 MIL, up to 28 Pin 600 MIL CMOS and TTL components, which are mostly used. It tests the function of these IC.s over theTruthtables. |
| TBTDIGB: | Digital Family-Testterminal, it can test up to 20 Pin 300 MIL, up to 28 Pin 600 MIL CMOS and TTL components, which are mostly used. It tests the function of these IC.s over theTruthtables and includes the possibility, to test the DC-Parameters. It needs the OPTION TBTDIGP, to be ready to test. |
| TBTANZ: | PASS/FAILCounter with presetcounter and Display. Adds the possibility, to preset an amount of GOOD or BAD Parts, the Tester will count these Parts and will stop as soon as the programmed amount is reached. This Option will be placed in the FamilyTestterminals and is required then for each Testterminal where it should be used. |
| TBTOC: | Optocoupler Testhead and Adapter to test these Parts on the DiscreteTestterminal. It adds the possibility to test Optocouplers in Packages up to 16 PIN DIL. Not required for the Option TBT MUX. Requires TBTSTT. |
| TBTIEEE: | Integration of IEEE488 Bus into the TBT 8812. Includes the Softwaredriver and the IEEE488 Card. |
| TBTRCL: | Hard- and Softwareintegration of an RCL-Bridge into the Soft and Hardware of the TBT 8812. Offers the automatic Test of RCLComponents with different frequencies. Also the Test of C and L on Discretes. The RCL-Bridge will be controlled over IEEE488Bus. |
| TBTC: | Hard- and Softwareintegration of an 1MHz C-Bridge into the TBT 8812. Offers the automatic Test of the internal Capacitance of Components with 1MHz. Can also be equipped with additional Sources, it depends on the application. |
| TBTTEMP: | Hard- and Softwareintegration of an Temptronics Thermostream into the TBT 8812. Offers the automatic Test of all Components under/with different Temperatures. Also for the Test with complex Thermostructures (several Temperatures, with different Testprograms). The Thermostream will be controlled over IEEE488Bus. |
| TBTLED: | Testhead to test LED.s on DCParameters and also Light Intensity. This Option consists of an Testhead with a CCD-Sensor and Adaptor. For Infrared Light, the Option TBTLEDA is used. |
| TBTNA: | This Option adds a 20nA Low Current Range to the TBT 8812, with a resolution of 10 pA. Plugs into a Discret Family-Testterminal or the TBTMUX. Is used to test FETTransistors or other Components with very low current measurements. Is only for Voltages up to 1000 Volts usable. |
| TBTPA: | This Option adds three additional Low Current Ranges to the TBT 8812, with 20nA, 2nA and 200pA, this gives a maximum resolution of 0.1 pA. Plugs into a Discret Family-Testterminal or the TBTMUX. Is used to test FET-Transistors or other Components with very low current measurements. Is only for Voltages up to 500 Volts usable. |
| TBTEXT: | This Option provides the Integration of an external IEEE488 based Instrument into Soft- and Hardware of the TBT 8812. |
| TBTSFCH: | This Option is a external Calibration Selftest of all Current and Voltage ranges over additional external IEEE-488 based Instruments. It includes a Voltage and a Current Meter. So this Selfcheck is traceable to any National Standard. |
| TBTSFCHF2: | This Option is an external Calibration Selftest of Current and Voltageranges over one additional external IEEE-488 based Instrument. It includes a Voltage and Current Meter. So this Selfcheck is traceable to any National Standard. |
| TBTSPARE: | Spare Part Kit, consisting of the following Modules: DC 1, 40V/20A Current/Voltage Source DC 2/4, 20V/20A and 200V/200mA Current/Voltage Source One Set of all Major Components used in the Tester. |
| TBT14BTU: | Substitutes the normal ADC in the TBT 8812 with a 14 BIT ADC (Analog Devices), with additional MeasMUX for 8 Inputs. Is used for special requirements at SmartPower Devices, Hybrids, and small Boards. All other capabilities like normal ADC. |
| TBT14BTU16: | Substitutes the normal ADC in the TBT 8812 with a 14 BIT ADC (Analog Devices), with additional MeasMUX for 16 Inputs. Is used for special requirements at SmartPower Devices, Hybrids, and small Boards. All other capabilities like normal ADC. |
| TBT16BTU: | Substitutes the normal ADC in the TBT 8812 with a 16 BIT ADC (Analog Devices), with additional MeasMUX for 8 Inputs. Is used for special requirements at SmartPower Devices, Hybrids, and small Boards. All other capabilities like normal ADC. |
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fax: [49] 8151/55228
tel.: [49] 8151/55227
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