Universal Component Testsystem TBT-8812

Here a Version in a 19" Rack.

The Component Tester TBT-8812 series is a completely computercontrolled system and is constructed in a modular way. Therefore we are able to configure the TBT-8812 exactly to the customers needs.

The TBT-8812 is the Testsystem for the next millenium, testing tomorrows Components!

The Universal Component Testsystem TBT-8812 is a LOW-COST solution for the discretes, power-discretes, power-hybrids, linears, mixed-signal, smart-power and digital components. ALPHA-TEST GmbH offers with this modular and flexible design the best and most cost-effective solution in its marketplace.

Because of the open, modular and flexible architecture the user will be enabled to configure the system with his todays needs and to expand the TBT-8812 as his needs will grow.

From the first beginning the Universal Component Testsystem TBT-8812 was designed with flexibility, mixed signal and powerdevices in mind. Unlike most of the other ATE-Equipment manufacturers, who have to add new capabilities to test different applications with their older designs, the TBT-8812 already has the features for the future included from the beginning.

ALPHA-TEST GmbH designed with the second generation of their component-testsystems the TBT-8812, the best solution for the needs of the new century, the 2000. All the knowledge ALPHA-TEST GmbH got from all the different applications of more then 60 installations overall in the world, their design engineers put into the TBT-8812. Some of the additional high-lights the engineers of ALPHA-TEST GmbH designed into the TBT-8812 are easy to use and fast DOS based window-software with a powerful automatic program generator and modularity of the systemhardware with a wide variety of sources, instruments and measurementsystems, all controllable over the internal parallelbus or over the optional IEEE-488-Bus. Network capability, easy interfacing to handler-/probersystems and high troughput brings high profitability.

Very high testspeed, low price and low after sales costs guarantee a very fast payback of the TBT-8812´s initial costs.

So the TBT-8812 is the right decision for the manufacturer as well as for the incoming inspection. This is guaranteed by the easy use, the multiuser and multiterminal capability. Multiusing means, the TBT-8812 can work with up to 4 family-testterminals in multiplexing, sequentially also with different testprograms. Four testterminals are sharing the sources and instruments of the system to get the highest troughput and the best utilization at lowest cost per component.

The testadaptors and testsockets needed for the different family-testterminals are available for almost all different component-housings. Necessary Handlingsystems can also be delivered for and together with the TBT-8812.

With this system all discretes, like bipolar transistors, diodes, FET´s, SCR´s, IGBT´s, regulators and others, linears, analog IC´s, digital IC´s, smart power´s and mixed-signal components can be tested.

Universal-Testsystem TBT-8812

Component Adaptor:

It is necessary to use adaptors to test all the different components in the different housings. An adaptor is the case, which brings the necessary connections from the connectors at the family-testterminal up to the device under test.

Included into the adaptor is also the testsocket for the DUT.

To do special tests, where you need additional relays and/or additional circuitry, the adaptor case is able to hold it and the connectors in the family-testterminal include the necessary power and signals to control this circuitry.

For semiautomatic adaptors, e.g. for high power modules, there are also the signals SOT (START OF TEST) and EOT (END OF TEST) available.

A safety-loop, which uses safety switches, is included in the adaptor and locks the start of test as long as the safety-cover is open.

Transistor-Adaptor, for bipolar Transistors

TO-220/TO-218

Universal-Testsystem TBT-8812

Testable Components:

The following components can be tested with the necessary testprocedures in the software of the TBT-8812 and the necessary Adapters (Options). The necessary Testsoftware comes with the necessary Adapter. Componentfamilies and tests can be implemented into the standard-software by us or after a special training-course, also by the user.

Option - Description:

TBT-DIS: Library of the normally used testparameters, which are necessary to build up a testprogram for discretes. These testparameters have to be filled out with the right values. Tests and components which are not built in the standard package will come with the necessary Adapter, when ordered. Some Components and Adapters will need on site installation of our technical staff.

TBT-LINP: Library of the normally used testparameters, which are necessary to build up a testprogram for linears (only when Testterminal is ordered). These testparameters have to be filled out with the right values.

TBT-DIGP: Program library for the Option TBT-DIGB, consists of about 600 testprograms for the mostly used CMOS- and TTL-IC´s. These testprograms are build up with the functional tests over truthtesttable and DC-parameters. Only with truthtable for Option TBT-DIGA

TBT-TIME: Timemeasoption to measure switchingtimes and delaytimes at the component. Consists of an into the System over IEEE-488 Bus integrated DSO with a max. resolution of 1,25 ns, depending on DSO used. Storage and displaying of the different switching-courves and others is possible.

DC 1-12: Current/Voltage Source, 4V/15A, 40V/15A, 12 bit resolution in each range.Used to stimulate the "Input" of components, necessary for discrete, linear and mixed signal components with more than 2 terminals.

DC 2/4-12: Current/Voltage Source, consists of 3 current/voltage sources with 12 bit resolution, 2V/20A, 20V/20A and 200V/200mA.This source is used for discrete components, also linear and mixed signal components.

DC 3-12: Current Source, 15V/200A, 12 bit resolution is used for all components that require more than 20A current. Only 300µs Pulses.

DC 3-12H: Current Source, 25V/200A, 12 bit resolution is used for all components that require more than 20A current. 500ms Pulse, for testing Zth.

DC 5-12: Current/Voltage Source, 2000V/10mA, 12 bit resolution. This source is required, if leakage and break- down with more than 200V should be tested.

DC 5.2-12: Current/Voltage Source, 2000V/20mA, 12 bit resolution. This source is required, if leakage and break- down with more than 200V should be tested.

DC 6-12: Current/Voltage Source, 3000V/10mA, 12 bit resolution. This source is required, if leakage and break- down with more than 200V should be tested.

DC 62-12: Current/Voltage Source, 3000V/20mA, 12 Bit resolution. This source is required, if leakage and break- down with more than 200V should be tested.

TBT-STT: Discrete-Family-Testterminal, this option is equipped with a matrix for 3000V/200A, to max. 4 terminal devices. Each TBT-8812 can use 4 of these testterminals and will handle 4 different testprograms sequentially. This testterminal can work with all adaptors for discrete devices. It also can be equipped with a handler interface. It has a binning display for 24 bins, and LEDs for "PASS", "FAIL" and "KELVIN-FAIL".

TBT-HV: Discrete-Family-Testterminal, this option is equipped with a matrix for 6000V/200A, to max 4 terminal devices. Each TBT-8812 can use 2 of these testterminals and will handle 2 different testprograms sequentially. This testterminal can work only with HV-adaptors for discrete devices. It also can be equipped with a handler interface. It has a binning display for max. 24 bins, and LEDs for "PASS", "FAIL" and "KELVIN FAIL".

TBT-HI: Handlerinterface for all family-testterminals to provide the different handshake-signals, to work with probing- and handlingssystems of all major suppliers. One for each family-testterminal needed.

Universal-Testsystem TBT-8812

Option Description:

Option: Description:

TBT-MTT: Matrix-Family-Testterminal, this option is equipped with a matrix for 2000V/200A for 4 terminal devices and also with a 5 X 24 crossmatrix for 1500V/20A. Each TBT-8812 can use 4 of those testterminals and will handle 4 different testprograms sequentially. This testterminal can work with all adaptors for discrete devices and also with all the adaptors for the TBT-MUX. It also can be equipped with a handler interface. It has a binning display for max. 24 bins and a contact failure LED. This family-testterminal is developed for passive and active arrays (RPACKS, transistor arrays a. o.), optocouplers, smart-powers and hybrids.

TBT-MUX1: Matrix for the TBT-STT, this option is equipped 3 X 18 crossmatrix for 500V/10A. Each TBT-STT can use 1 of these options. This option is developed for passive and active arrays (RPACKS, transistor arrays a. o.), optocouplers, smart-powers and hybrids.

TBT-MUX2: Matrix for the TBT-STT, this option is equipped 3 X 18 crossmatrix for 1000V/10A. Each TBT-STT can use 1 of these options. This option is developed for passive and active arrays (RPACKS, transistor arrays a. o.), optocouplers, smart-powers and hybrids.

TBT-DIGF: Digital-Family-Testterminal can test up to 20 pin CMOS and TTL components, which are mostly used. It tests the function of IC´s over the truthtable and includes a library of at about 600 testprograms. It has an

additional function to read, write, store and burn EPROMS, and test with this function also static RAMS.

TBT-DIGA: Digital-Family-Testterminal can test up to 20 pin 300 MIL, up to 28 pin 600 MIL CMOS and TTL com- ponents, which are mostly used. It tests the function of these ICs over the truthtables.

TBT-ANZ: PASS/FAIL-Counter with preset counter and display. Adds the possibility to preset an amount of GOOD or BAD parts. The tester will count these parts and will stop as soon as the programmed amount is reached. This option will be placed in the family-testterminals and is required accordingly for each testterminal where it should be used.

TBT-OC: Optocoupler Testhead and Adapter to test these parts on the discrete-testterminal. It adds the possibility to test optocouplers in packages up to 16 PIN DIL. Not required for option TBT-MUX. Requires TBT-STT.

TBT-IEEE: Integration of IEEE-488 Bus into the TBT-8812. Includes the softwaredriver and the IEEE-488 card.

TBT-RCL: Hard- and Softwareintegration of an RCL-Bridge into the TBT-8812. Offers the automatic test of RCL- Components with different frequencies. Also the test of C and L on discretes. The RCL-Bridge will be controlled over IEEE-488-Bus.

TBT-C: Hard- and Softwareintegration of an 1MHz C-Bridge into the TBT-8812. Offers the automatic test of the internal capacitance of components with 1MHz. Can also be equipped with additional sources, it depends on the application.

TBT-TMP: Hard- and Softwareintegration of an Temptronics Thermostream into the TBT-8812. Offers the automatic test of all components under/with different temperatures. Also for the test with complex thermostructures (several temperatures, with different testprograms). The thermostream will be controlled over IEEE-Bus.

TBT-LED: Testhead to test LEDs on DC-Parameters and also Light Intensity. This option consists of an testhead with a CCD-sensor and adaptor. For infrared light, the option TBT-LEDA have to be used.

TBT-NA: This option adds a 20nA low current range to the TBT-8812 with a resolution of 10 pA. Plugs into a dis- cret-family-testterminal or the TBT-MUX. Is used to test FET-transistors or other components with very low current masurements. Is usable only for voltages up to 1000 Volts. It needs special low-current adaptors to reach the accuracy.

TBT-PA: This option adds three additional low current ranges to the TBT-8812 with 20nA, 2nA and 200pA, this gives a maximum resolution of 100 fA. Plugs into a discret family-testterminal or the TBT-MUX. Is used to test FET-transistors or other components with very low current measurements. Is usable only for voltages up to 200 Volts. Higher voltages on request. It needs special low-current adaptors to reach the accuracy.

TBT-EXT: This option provides the integration of an external IEEE-488 based instrument into soft- and hardware of the TBT-8812.

TBT-SFCH: This option is an external calibration selftest of all current- and voltage ranges over additional external IEEE-488 based instruments. It includes a voltage and a current meter. So this self-check is traceable to any national standard.

TBT-SFCF2: This option is an external calibration selftest of current- and voltage ranges over one additional external IEEE-488 based instrument. It includes a voltage and current meter, Fluke 8842. So this selfcheck is traceable to any national standard.

TBT-SPARE: Spare Part Kit, consisting of the following modules:

- DC 1, 40V/20A Current/Voltage Source

- DC 2/4, 20V/20A and 200V/200mA Current/Voltage Source

- One Set of all Major Components used in the tester.

Additional Options and News on Request.

More Technical Details as well.

Universal-Testsystem TBT-8812

Option TBT-STT:

The Standard-Family-Testterminal TBT-STT is an interface/matrix between the tester and the component-adaptor. These family-testterminals are always dedicated to a defined component-family and include the necessary matrix for connecting the sources and the ADC to the DUT-adaptor. Sometimes they also extend the standardsystem with additional hardware necessary for the different needs.

The Standard-Testterminal is for the component family of the discretes (also extendable with different options) to connect the sources and the ADC to the defined componentpin. Included into this terminal is a binning-display and PASS/FAIL - LEDS.

All different safety-circuitry and covers are available on customers request.

The maximum voltage for this testterminal is 3000V. The maximum current is 200A.

With option STT-HC the TBT-STT is usable up to 600A.

Universal-Testsystem TBT-8812

Option TBT-HV:

The HIGHVOLTAGE FamilyTestterminal TBT-HV is an interface/matrix between the tester and the componentadaptor. These familytestterminals are always dedicated to a defined componentfamily and extend sometimes also the standardsystem with additional Hardware necessary for the different needs.

The HIGHVOLTAGE Testterminal is only for the component family of the discretes (also optocoupler and others with special option) to connect the sources and the ADC to the defined componentpin. Included into this terminal is a binningdisplay and PASS/FAIL LED.

All different safetycircuitry and covers are available on customers request.

The maximum voltage for this testterminal is 6000V. The maximum current is

200A.

With option HV-HC the TBT-HV is usable up to 600A.

Universal-Testsystem TBT-8812

Option Description:

Typenumber: TBT-NA

The lowcurrent option TBT-NA is mounted on top of the front of the TBT-STT. It fits into the slot, where the adaptor normally is. The adaptor will fit on top of this option. The option TBTNA adds an additional currentrange to the TBT8812.

Attention! This option is only for currents up to max. 10A and only for voltages up to 1000V.

Usage: The option TBT-NA is used to measure leakage current at components with very low leakages, e.g. FET transistors and others. It needs special low-currents adaptors to reach the accuracy.

Range: Resolution: Accuracy:

20.00 nA       10 pA                        +/-0,5%FS, +/-2,5%VALUE

Typenumber: TBT-PA

The low current option TBT-PA is mounted on top of the front of the TBT-STT. It fits into the slot, where the adaptor normally is. The adaptor will fit on top of this option.

The option TBTPA adds 3 additional currentranges to the TBT-8812.

Attention! This option is only for currents up to max. 10A and only for voltages up to 1000V.

Usage: The option TBT-PA is used to measure leakage current at components with very low leakages, e.g. FET transistors and others.

Range:     Resolution:        Accuracy:

20.00 nA             10 pA                                   +/-0,5% FS, +/-2,5 MV

2.000 nA             1 pA                                     +/-1,5% FS, +/-5% MV

200.0 pA             100 FemtoAmperes          +/-10% FS, +/-15% MV